The gateway to next generation of ultrastructural analysis for life science: Back-scattered beam imaging and electron beam tomography ; Koujiro Tohyama

Analysis of biological specimens by transmission electron microscope (TEM) has entered a new era. Previously, we have to use ultrathin sections with approximate 100nm-thickness on a grid for TEM observation. In other words, the two different “constraints” of a “grid” and the “thickness of ultrathin section”, approximate 100nm, represented limitations for the viable area, and for the precision and depth that could be observed, i.e. not-wide, not-precise, and not-deep, respectively. The ultimate dream of researchers in every field was “wide”, “deep” and “precise” analysis of specimens. With recent advances in instrument design, relief from these “constraints” has arrived at last. Two technologies brought into wide, recent use have provided the solution: Electron beam tomography and backscattered electron imaging. Here we discuss these analytical technologies from our own experience and with some reference to specific data, and consider potential directions for electron microscopy analysis in the life sciences fields.